11-01-7060-vl Scanning probe microscopy in materials science

Lehrende: PD Dr. rer. nat. Christian Dietz

Veranstaltungsart: Vorlesung

Orga-Einheit: FB11 / Materialwissenschaft

Anzeige im Stundenplan: 11-01-7060-vl

Fach:

Anrechenbar für:

Unterrichtssprache: Englisch

Min. | Max. Teilnehmerzahl: - | -

Lehrinhalte:
Introduction into Nanoscience and Nanotechnology
    - Concepts of nanomanufacturing
    - Surface forces

Introduction into Scanning X Microscopy
    - Scanning Force Microscopy
    - Scanning Tunneling Microscopy
    - Scanning Near-Field Optical Microscopy

Scanning Force Microscopy
    - Instrumentation
    - Theory of feedback mechanisms
    - High resolution imaging
    - Force measurements
    - Dynamic measurement modes
    - Surface characterization in liquids, air, and vacuum
    - Electrical Force Microscopy
    - Magnetic Force Microscopy

Scanning Tunneling Microscopy
    - The tunneling effect
    - Surface characterization
    - Tunneling spectroscopy

Scanning Near-Field Optical Microscopy
    - The optical near-field
    - Fiber-based methods
    - Scattering methods
    - Nanospectroscopy