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Instructors: Prof. Dr. rer. nat. Wolfgang Donner; Prof. Dr. Maria Eugenia Toimil-Molares
Event type:
Lecture
Org-unit: Dept. 11 - Institute of Materials Science
Displayed in timetable as:
Adv.Meth.Mat.Sci.
Subject:
Crediting for:
Hours per week:
3
Language of instruction:
Englisch
Min. | Max. participants:
- | -
Course Contents:
The first part of the lecture covers scattering and spectroscopic methods for structural characterization like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance and others.
In the second part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
Literature:
Underneath the Bragg peaks: Structural analysis of complex materials
T. Egami and S.J.L. Billinge
Pergamon 2003
Structure from diffraction methods
Edt. by D.W. Bruce et al.
Wiley 2014
Small angle x-ray scattering
O. Glatter and O. Kratky
Academic Press 1982
Local structural characterization
Edt. by D.W. Bruce et al.
Wiley 2014
Preconditions:
Bachelor of Science in Materials Science or comparable.
Expected Number of Participants:
120
Official Course Description:
The lecture deals with characterization methods of materials science.
Both structural and chemical analysis are covered.
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