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Instructors: Prof. Dr. rer. nat. Wolfgang Donner; Prof. Dr. rer. nat. Wolfgang Ensinger
Event type:
Lecture
Org-unit: Dept. 11 - Institute of Materials Science
Displayed in timetable as:
Adv.Meth.Mat.Sci.
Subject:
Crediting for:
Hours per week:
3
Language of instruction:
Englisch
Min. | Max. participants:
- | -
Course Contents:
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
Preconditions:
Bachelor of Science in Materials Science or comparable.
Expected Number of Participants:
50
Official Course Description:
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
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