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Instructors: PD Dr. rer. nat. Christian Dietz
Event type:
Lecture
Org-unit: Dept. 11 - Institute of Materials Science
Displayed in timetable as:
11-01-7060-vl
Subject:
Crediting for:
Language of instruction:
Englisch
Min. | Max. participants:
- | -
Course Contents:
Introduction into Nanoscience and Nanotechnology
- Concepts of nanomanufacturing
- Surface forces
Introduction into Scanning Probe Microscopy
- Scanning Force Microscopy
- Scanning Tunneling Microscopy
- Scanning Near-Field Optical Microscopy
Scanning Force Microscopy
- Instrumentation
- Theory of feedback control systems
- High resolution imaging
- Force spectroscopy
- Static and dynamic measurement modes
- Surface characterization in liquids, air, and vacuum
- Amplitude and frequency modulation
- Advanced force microscopy methods for materials scientists
Scanning Tunneling Microscopy
- The tunneling effect
- Surface characterization
- Tunneling spectroscopy
Scanning Near-Field Optical Microscopy
- The optical near-field
- Fiber-based methods
- Scattering methods
- Nanospectroscopy
Literature:
will be announced
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