11-02-9201-vl Electron Energy-Loss-Spectroscopy (EELS): Methods and Applications in Geo- and Materials Sciences

Veranstaltungsdetails

Lehrende: Apl. Prof. Dr. rer. nat. Peter van Aken

Veranstaltungsart: Vorlesung und Übung

Orga-Einheit: FB11 / Angewandte Geowissenschaften

Anzeige im Stundenplan: VL+UE EELS

Fach:

Anrechenbar für:

Semesterwochenstunden: 2

Unterrichtssprache: Englisch

Min. | Max. Teilnehmerzahl: - | -

Lehrinhalte:
The lecture is structured in four chapters. In the introduction, a short description of electron-specimen interactions and the principles of an EELS spectrum will be given. Furthermore, a short overview of its history of will be presented. In chapter 2 and 3, the instrumentation for EELS and the physics of electron scattering will be treated more extensively. Finally, applications of EELS in Geo- and Materials Sciences will be presented.
Chapter 1: Introduction
Chapter 2: EELS Instrumentation
Chapter 3: Electron Scattering Theory
Chapter 4: Applications of EELS

Literatur:
Brydson R.: Electron Energy Loss Spectroscopy. Royal Microscopical Society, Microscopy Handbooks Vol. 48, BIOS Scientific Publishers Limited (2001).
Disko M.M., Ahn C.C., and Fultz B. (eds.): Transmission electron energy-loss spectrometry in material science. TMS EMPMD Monograph Series No. 2. The Minerals, Metals and Materials Society, Warrendale, PA (1992).
Egerton R.F.: Electron energy-loss spectroscopy in the electron microscope. Second edition, Plenum Press, New York (1996).
Fultz B. and Howe J. M.: Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, Heidelberg, New York, Tokyo (2001).
Reimer L.: Transmission Electron Microscopy, Physics of Image Formation and Microanalysis. Springer Series in Optical Sciences, 36, Springer-Verlag, Berlin, Heidelberg, New York, dritte Auflage (1993).
Reimer L. (Ed.): Energy-Filtering Transmission Electron Microscopy. Springer Series in Optical Sciences, 71, Springer-Verlag, Berlin, Heidelberg, New York (1995).
Williams D. B. and Carter C. B.: Transmission Electron Microscopy. Vol. 1-4, Plenum Press, New York (1996).

Literatur
Termine
Datum Von Bis Raum Lehrende
1 Fr, 19. Okt. 2012 10:30 12:00 B201/35 Apl. Prof. Dr. rer. nat. Peter van Aken
2 Mo, 4. Feb. 2013 13:00 17:00 Max Planck Institute for Intelligent Systems, Stuttgart Apl. Prof. Dr. rer. nat. Peter van Aken
3 Di, 5. Feb. 2013 09:00 17:00 Max Planck Institute for Intelligent Systems, Stuttgart Apl. Prof. Dr. rer. nat. Peter van Aken
4 Mi, 6. Feb. 2013 09:00 17:00 Max Planck Institute for Intelligent Systems, Stuttgart Apl. Prof. Dr. rer. nat. Peter van Aken
Übersicht der Kurstermine
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Lehrende
Apl. Prof. Dr. rer. nat. Peter van Aken