Lehrende: Dr. Philipp Komissinskiy
Veranstaltungsart: Kurs
Orga-Einheit: FB11 / Materialwissenschaft
Anzeige im Stundenplan: Course HRSEM
Fach:
Anrechenbar für:
Semesterwochenstunden: 0,5
Unterrichtssprache: Englisch
Min. | Max. Teilnehmerzahl: - | -
Lehrinhalte: Basics of scanning electron microscopy; Breakdown of scanning electron microscopes (SEM) Electron and x-ray detectors Analysis of topography with secondary electrons Back scattered electrons for materials contrast Characteristic x-rays for microanalysis Sample preparation for SEM studies Introduction to the SEM Philips XL30-FEG: access to the SEM is granted for the course participants
Literatur: 1. J. Goldstein et al., Scanning Electron Microscopy and X-ray Microanalysis, fourth edition, Springer Science + Business Media, New York 2018, DOI: https://doi.org/10.1007/978-1-4939-6676-9 2. L. Reimer, Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, 2nd edition, Springer-Verlag 1998.
Voraussetzungen: M.Sc. and Ph.D. students of the departments of Materials Science, Physics and Chemistry
Zusätzliche Informationen: Course plan: 2 lectures: 6 academic hours Practical exercise at the SEM Philips XL30-FEG: 6 academic hours Report on the practical exercise part is compulsory for before examination Examination: oral Registration for the course for all Students (starting from the 7th Semester) is via TUCaN Registration via e-mail is possible for those interested in the access to the SEM
Online-Angebote: moodle
